1.1 This guide covers recommended procedures for the use of X-ray testers (that is, sources with a photon spectrum having ≈10 keV mean photon energy and ≈50 keV maximum energy) in testing semiconductor discrete devices and integrated circuits for effects from ionizing radiation.
Product Details
- Published:
- 03/01/2018
- Number of Pages:
- 18
- File Size:
- 1 file , 400 KB
- Redline File Size:
- 2 files , 810 KB
