1.1 This practice covers a procedure for fabricating both green and sintered test samples of silicon carbide and silicon nitride containing inclusions. These samples can be used to determine the sensitivity and detection capability of a nondestructive examination (NDE) method.
Product Details
- Published:
- 01/01/2014
- Number of Pages:
- 3
- File Size:
- 1 file , 62 KB
