BS CECC 00013:1985

Original price was: $152.40.Current price is: $76.20.

Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
standard by BSI Group, 08/30/1985

Category:

Describes equipment and procedures to be used for SEM inspection of discrete semiconductor devices and integrated circuits.

Product Details

Published:
08/30/1985
ISBN(s):
0580146022
Number of Pages:
28
File Size:
1 file , 820 KB
Product Code(s):
00140153, 00140153, 00140153