1.1 This guide acquaints the X-ray photoelectron spectroscopy (XPS) user with the various charge control and charge shift referencing techniques that are and have been used in the acquisition and interpretation of XPS data from surfaces of insulating specimens and provides information needed for reporting the methods used to customers or in the literature.
Product Details
- Published:
- 06/01/2015
- Number of Pages:
- 7
- File Size:
- 1 file , 120 KB
- Redline File Size:
- 2 files , 220 KB
